TEST_NAME : Wafer
TEST_DATE : 24_09_30-12_06_13
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-002-018-06 | FUSED_ID : 6359364768409592102
  IC_TEMP :  -68.95 | VDDM : 1118.01 | AUX_INT :   -9.58 | CsaBias :   68.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60296e-03 / 2
  ADC_P0  : -9.58139e-03 ± 2.71381e-02
  ADC_P1  : 8.69724e-03 ± 6.80268e-04
  ADC_P2  : -6.67109e-06 ± 3.38564e-06
  CSA_Chi2/NDF : 1.39362e-04 / 2
  CSA_P0  : 5.84403e-02 ± 7.87400e-03
  CSA_P1  : 9.55376e-03 ± 5.93249e-04
  CSA_P2  : -4.60280e-05 ± 9.03448e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2869', '1.800', '0.1090', '1.800', '0.0919', '7.000', '0.7082', 1, 1, 1, 1, 1727690773.5573733]
VI_after__Init : ['1.202', '0.2871', '1.800', '0.1090', '1.800', '0.0863', '7.000', '0.7083', 1, 1, 1, 1, 1727690781.8347766]
VI_at__the_End : ['1.202', '0.4749', '1.800', '0.1344', '1.800', '0.1210', '7.000', '0.7090', 1, 1, 1, 1, 1727690849.5806308]