TEST_NAME : Wafer
TEST_DATE : 24_09_30-12_27_27
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-003-011-12 | FUSED_ID : 6359364768409596092
  IC_TEMP :  -57.79 | VDDM : 1122.57 | AUX_INT :  -18.10 | CsaBias :   64.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66175e-03 / 2
  ADC_P0  : -1.80957e-02 ± 2.81922e-02
  ADC_P1  : 8.35473e-03 ± 6.86260e-04
  ADC_P2  : -5.30218e-06 ± 3.33189e-06
  CSA_Chi2/NDF : 1.27019e-04 / 2
  CSA_P0  : 5.77324e-02 ± 7.51721e-03
  CSA_P1  : 9.47420e-03 ± 5.66368e-04
  CSA_P2  : -4.25474e-05 ± 8.62511e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [39, 70, 91, 102, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [29, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2722', '1.800', '0.1547', '1.800', '0.0899', '7.000', '0.7081', 1, 1, 1, 1, 1727692047.1071248]
VI_after__Init : ['1.202', '0.2722', '1.800', '0.1548', '1.800', '0.0843', '7.000', '0.7079', 1, 1, 1, 1, 1727692055.2834492]
VI_at__the_End : ['1.202', '0.4819', '1.800', '0.1374', '1.800', '0.1161', '7.000', '0.7088', 1, 1, 1, 1, 1727692116.0394912]