TEST_NAME : Wafer
TEST_DATE : 24_09_30-12_25_50
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-003-012-12 | FUSED_ID : 6359364768409596108
  IC_TEMP :  -59.27 | VDDM : 1108.54 | AUX_INT :   -7.73 | CsaBias :   68.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08165e-03 / 2
  ADC_P0  : -7.72892e-03 ± 2.22512e-02
  ADC_P1  : 8.54629e-03 ± 5.52065e-04
  ADC_P2  : -6.48024e-06 ± 2.70649e-06
  CSA_Chi2/NDF : 1.78159e-04 / 2
  CSA_P0  : 5.80032e-02 ± 8.90279e-03
  CSA_P1  : 9.92348e-03 ± 6.70761e-04
  CSA_P2  : -4.66370e-05 ± 1.02149e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [32, 58, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1705', '1.800', '0.1367', '1.800', '0.0840', '7.000', '0.7081', 1, 1, 1, 1, 1727691950.1400201]
VI_after__Init : ['1.202', '0.1704', '1.800', '0.1367', '1.800', '0.0786', '7.000', '0.7080', 1, 1, 1, 1, 1727691958.2013893]
VI_at__the_End : ['1.202', '0.4958', '1.800', '0.1394', '1.800', '0.1143', '7.000', '0.7087', 1, 1, 1, 1, 1727692025.648888]