TEST_NAME : Wafer
TEST_DATE : 24_09_30-12_17_41
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-003-017-11 | FUSED_ID : 6359364768409596187
  IC_TEMP :  -64.06 | VDDM : 1121.04 | AUX_INT :   -6.55 | CsaBias :   68.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30152e-03 / 2
  ADC_P0  : -6.55060e-03 ± 2.44486e-02
  ADC_P1  : 8.37979e-03 ± 6.00718e-04
  ADC_P2  : -6.04164e-06 ± 2.91026e-06
  CSA_Chi2/NDF : 1.49221e-04 / 2
  CSA_P0  : 5.72069e-02 ± 8.14775e-03
  CSA_P1  : 9.95543e-03 ± 6.13874e-04
  CSA_P2  : -4.97085e-05 ± 9.34858e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 56, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [28]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1455', '1.800', '0.1163', '1.800', '0.0841', '7.000', '0.7080', 1, 1, 1, 1, 1727691460.865491]
VI_after__Init : ['1.202', '0.1455', '1.800', '0.1164', '1.801', '0.0790', '7.000', '0.7083', 1, 1, 1, 1, 1727691469.0787594]
VI_at__the_End : ['1.202', '0.4825', '1.800', '0.1377', '1.800', '0.1158', '7.000', '0.7090', 1, 1, 1, 1, 1727691535.030845]