TEST_NAME : Wafer
TEST_DATE : 24_09_30-12_38_56
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-004-008-04 | FUSED_ID : 6359364768409600132
  IC_TEMP :  -62.26 | VDDM : 1121.59 | AUX_INT :   -9.95 | CsaBias :   76.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64647e-03 / 2
  ADC_P0  : -9.94629e-03 ± 2.75126e-02
  ADC_P1  : 8.67762e-03 ± 6.91903e-04
  ADC_P2  : -6.35199e-06 ± 3.46332e-06
  CSA_Chi2/NDF : 2.00293e-04 / 2
  CSA_P0  : 5.95034e-02 ± 9.43964e-03
  CSA_P1  : 1.02563e-02 ± 7.11209e-04
  CSA_P2  : -5.08902e-05 ± 1.08309e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2010', '1.800', '0.1541', '1.800', '0.0856', '7.000', '0.7090', 1, 1, 1, 1, 1727692736.0690126]
VI_after__Init : ['1.201', '0.2009', '1.800', '0.1542', '1.800', '0.0786', '7.000', '0.7079', 1, 1, 1, 1, 1727692744.7793128]
VI_at__the_End : ['1.202', '0.4961', '1.800', '0.1432', '1.800', '0.1156', '7.000', '0.7087', 1, 1, 1, 1, 1727692807.4093826]