TEST_NAME : Wafer
TEST_DATE : 24_09_30-12_55_09
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-004-018-03 | FUSED_ID : 6359364768409600291
  IC_TEMP :  -57.14 | VDDM : 1128.50 | AUX_INT :   -8.88 | CsaBias :   81.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48316e-03 / 2
  ADC_P0  : -8.87738e-03 ± 2.61247e-02
  ADC_P1  : 8.29087e-03 ± 6.35102e-04
  ADC_P2  : -5.60168e-06 ± 3.06369e-06
  CSA_Chi2/NDF : 1.18745e-04 / 2
  CSA_P0  : 5.89991e-02 ± 7.26825e-03
  CSA_P1  : 9.55882e-03 ± 5.47610e-04
  CSA_P2  : -4.18441e-05 ± 8.33945e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [2]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [76]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4955', '1.800', '0.1772', '1.800', '0.0975', '7.000', '0.7079', 1, 1, 1, 1, 1727693709.2261615]
VI_after__Init : ['1.201', '0.4963', '1.800', '0.1773', '1.800', '0.0920', '7.000', '0.7080', 1, 1, 1, 1, 1727693717.2597191]
VI_at__the_End : ['1.202', '0.4932', '1.800', '0.1400', '1.800', '0.1125', '7.000', '0.7088', 1, 1, 1, 1, 1727693783.2497907]