TEST_NAME : Wafer
TEST_DATE : 24_09_30-13_00_03
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-004-021-03 | FUSED_ID : 6359364768409600339
  IC_TEMP :  -55.34 | VDDM : 1124.20 | AUX_INT :   -8.65 | CsaBias :   89.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25228e-03 / 2
  ADC_P0  : -8.65499e-03 ± 2.39771e-02
  ADC_P1  : 8.24236e-03 ± 5.79680e-04
  ADC_P2  : -5.47761e-06 ± 2.78610e-06
  CSA_Chi2/NDF : 1.24695e-04 / 2
  CSA_P0  : 5.68113e-02 ± 7.44811e-03
  CSA_P1  : 9.94009e-03 ± 5.61161e-04
  CSA_P2  : -4.47015e-05 ± 8.54582e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [66]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3633', '1.800', '0.1460', '1.800', '0.0894', '7.000', '0.7080', 1, 1, 1, 1, 1727694003.31955]
VI_after__Init : ['1.202', '0.3634', '1.800', '0.1458', '1.800', '0.0841', '7.000', '0.7083', 1, 1, 1, 1, 1727694011.3599913]
VI_at__the_End : ['1.201', '0.5011', '1.800', '0.1366', '1.800', '0.1120', '7.000', '0.7088', 1, 1, 1, 1, 1727694078.0729032]