TEST_NAME : Wafer
TEST_DATE : 24_09_30-13_39_02
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-005-004-09 | FUSED_ID : 6359364768409604169
  IC_TEMP :  -65.18 | VDDM : 1116.06 | AUX_INT :  -10.27 | CsaBias :   67.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73793e-03 / 2
  ADC_P0  : -1.02667e-02 ± 2.82358e-02
  ADC_P1  : 8.73511e-03 ± 7.03912e-04
  ADC_P2  : -6.99014e-06 ± 3.48653e-06
  CSA_Chi2/NDF : 1.64451e-04 / 2
  CSA_P0  : 5.61170e-02 ± 8.55342e-03
  CSA_P1  : 1.04387e-02 ± 6.44439e-04
  CSA_P2  : -5.53209e-05 ± 9.81404e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 87, 98, 117, 124, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3300', '1.800', '0.1881', '1.800', '0.0919', '7.000', '0.7082', 1, 1, 1, 1, 1727696342.1097405]
VI_after__Init : ['1.201', '0.3302', '1.800', '0.1881', '1.800', '0.0859', '7.000', '0.7081', 1, 1, 1, 1, 1727696350.1381607]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1379', '1.800', '0.1147', '7.000', '0.7090', 1, 1, 1, 1, 1727696409.6387844]