TEST_NAME : Wafer
TEST_DATE : 24_09_30-13_43_56
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-006-005-07 | FUSED_ID : 6359364768409608279
  IC_TEMP :  -57.24 | VDDM : 1123.88 | AUX_INT :   -7.69 | CsaBias :   76.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.36531e-04 / 2
  ADC_P0  : -7.68911e-03 ± 2.06794e-02
  ADC_P1  : 8.48882e-03 ± 5.10156e-04
  ADC_P2  : -6.30041e-06 ± 2.49170e-06
  CSA_Chi2/NDF : 1.58010e-04 / 2
  CSA_P0  : 5.70337e-02 ± 8.38426e-03
  CSA_P1  : 1.00380e-02 ± 6.31693e-04
  CSA_P2  : -4.70685e-05 ± 9.61994e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2170', '1.800', '0.1343', '1.800', '0.0821', '7.000', '0.7080', 1, 1, 1, 1, 1727696636.6139712]
VI_after__Init : ['1.201', '0.2170', '1.800', '0.1344', '1.800', '0.0768', '7.000', '0.7079', 1, 1, 1, 1, 1727696644.5873482]
VI_at__the_End : ['1.201', '0.4982', '1.800', '0.1381', '1.801', '0.1119', '7.000', '0.7089', 1, 1, 1, 1, 1727696705.64081]