TEST_NAME : Wafer
TEST_DATE : 24_09_30-13_53_44
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-006-011-07 | FUSED_ID : 6359364768409608375
  IC_TEMP :  -56.19 | VDDM : 1122.16 | AUX_INT :   -7.12 | CsaBias :   67.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.88819e-04 / 2
  ADC_P0  : -7.12063e-03 ± 2.01486e-02
  ADC_P1  : 8.30574e-03 ± 4.88039e-04
  ADC_P2  : -6.04455e-06 ± 2.33431e-06
  CSA_Chi2/NDF : 1.16895e-04 / 2
  CSA_P0  : 5.88541e-02 ± 7.21140e-03
  CSA_P1  : 9.94784e-03 ± 5.43327e-04
  CSA_P2  : -4.58463e-05 ± 8.27423e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [7, 42]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [11, 45, 63, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4887', '1.800', '0.1753', '1.800', '0.0940', '7.000', '0.7079', 1, 1, 1, 1, 1727697224.0238974]
VI_after__Init : ['1.201', '0.4896', '1.800', '0.1754', '1.800', '0.0887', '7.000', '0.7083', 1, 1, 1, 1, 1727697232.0284202]
VI_at__the_End : ['1.201', '0.4994', '1.800', '0.1386', '1.800', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1727697292.5797758]