TEST_NAME : Wafer
TEST_DATE : 24_09_30-13_55_21
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-006-012-07 | FUSED_ID : 6359364768409608391
  IC_TEMP :  -54.52 | VDDM : 1125.65 | AUX_INT :   -9.10 | CsaBias :   87.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30157e-03 / 2
  ADC_P0  : -9.09759e-03 ± 2.44109e-02
  ADC_P1  : 8.14621e-03 ± 5.73630e-04
  ADC_P2  : -5.85040e-06 ± 2.67648e-06
  CSA_Chi2/NDF : 7.62315e-05 / 2
  CSA_P0  : 5.72248e-02 ± 5.82357e-03
  CSA_P1  : 9.30714e-03 ± 4.38764e-04
  CSA_P2  : -3.82971e-05 ± 6.68186e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [0, 26, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1272', '1.800', '0.1474', '1.800', '0.0843', '7.000', '0.7079', 1, 1, 1, 1, 1727697321.4655993]
VI_after__Init : ['1.201', '0.1271', '1.800', '0.1473', '1.800', '0.0789', '7.000', '0.7080', 1, 1, 1, 1, 1727697329.4849892]
VI_at__the_End : ['1.202', '0.4885', '1.800', '0.1353', '1.800', '0.1115', '7.000', '0.7086', 1, 1, 1, 1, 1727697389.2894917]