TEST_NAME : Wafer
TEST_DATE : 24_09_30-14_52_28
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-007-006-10 | FUSED_ID : 6359364768409612394
  IC_TEMP :  -64.56 | VDDM : 1099.59 | AUX_INT :  -10.02 | CsaBias :   81.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63240e-03 / 2
  ADC_P0  : -1.00165e-02 ± 2.73669e-02
  ADC_P1  : 8.38349e-03 ± 6.58280e-04
  ADC_P2  : -6.28496e-06 ± 3.14630e-06
  CSA_Chi2/NDF : 1.57214e-04 / 2
  CSA_P0  : 5.59003e-02 ± 8.36312e-03
  CSA_P1  : 9.64907e-03 ± 6.30101e-04
  CSA_P2  : -4.67634e-05 ± 9.59569e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1834', '1.800', '0.1461', '1.800', '0.0839', '7.000', '0.7079', 1, 1, 1, 1, 1727700748.2227771]
VI_after__Init : ['1.202', '0.1834', '1.800', '0.1460', '1.800', '0.0783', '7.000', '0.7080', 1, 1, 1, 1, 1727700756.3250704]
VI_at__the_End : ['1.202', '0.4717', '1.800', '0.1345', '1.800', '0.1154', '7.000', '0.7088', 1, 1, 1, 1, 1727700824.4840379]