TEST_NAME : Wafer
TEST_DATE : 24_09_30-14_50_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-007-007-10 | FUSED_ID : 6359364768409612410
  IC_TEMP :  -55.48 | VDDM : 1110.16 | AUX_INT :   -8.00 | CsaBias :   73.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06524e-03 / 2
  ADC_P0  : -7.99831e-03 ± 2.20676e-02
  ADC_P1  : 8.24783e-03 ± 5.25609e-04
  ADC_P2  : -6.14127e-06 ± 2.47615e-06
  CSA_Chi2/NDF : 1.56073e-04 / 2
  CSA_P0  : 5.73321e-02 ± 8.33270e-03
  CSA_P1  : 9.91126e-03 ± 6.27809e-04
  CSA_P2  : -4.87688e-05 ± 9.56078e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3351', '1.800', '0.1468', '1.799', '0.0910', '7.000', '0.7081', 1, 1, 1, 1, 1727700650.601077]
VI_after__Init : ['1.202', '0.3358', '1.800', '0.1469', '1.800', '0.0852', '7.000', '0.7083', 1, 1, 1, 1, 1727700659.3244796]
VI_at__the_End : ['1.202', '0.4837', '1.800', '0.1372', '1.803', '0.1125', '7.000', '0.7090', 1, 1, 1, 1, 1727700718.3620017]