TEST_NAME : Wafer
TEST_DATE : 24_09_30-14_42_40
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-007-012-10 | FUSED_ID : 6359364768409612490
  IC_TEMP :  -60.05 | VDDM : 1124.70 | AUX_INT :   -7.62 | CsaBias :   70.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05942e-03 / 2
  ADC_P0  : -7.62302e-03 ± 2.20360e-02
  ADC_P1  : 8.68404e-03 ± 5.60207e-04
  ADC_P2  : -6.35913e-06 ± 2.81956e-06
  CSA_Chi2/NDF : 1.30085e-04 / 2
  CSA_P0  : 6.03149e-02 ± 7.60738e-03
  CSA_P1  : 9.77635e-03 ± 5.73161e-04
  CSA_P2  : -4.53349e-05 ± 8.72857e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [25, 32, 92, 111, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [48, 90, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2355', '1.800', '0.1452', '1.800', '0.0935', '7.000', '0.7081', 1, 1, 1, 1, 1727700160.332733]
VI_after__Init : ['1.201', '0.2355', '1.800', '0.1451', '1.800', '0.0880', '7.000', '0.7081', 1, 1, 1, 1, 1727700168.3131344]
VI_at__the_End : ['1.201', '0.4923', '1.800', '0.1405', '1.800', '0.1168', '7.000', '0.7088', 1, 1, 1, 1, 1727700236.525072]