TEST_NAME : Wafer
TEST_DATE : 24_09_30-14_41_01
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-007-013-10 | FUSED_ID : 6359364768409612506
  IC_TEMP :  -57.80 | VDDM : 1122.49 | AUX_INT :   -8.09 | CsaBias :   72.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19756e-03 / 2
  ADC_P0  : -8.08794e-03 ± 2.34495e-02
  ADC_P1  : 8.06996e-03 ± 5.56813e-04
  ADC_P2  : -5.27363e-06 ± 2.62158e-06
  CSA_Chi2/NDF : 1.28150e-04 / 2
  CSA_P0  : 5.71153e-02 ± 7.55061e-03
  CSA_P1  : 9.87142e-03 ± 5.68884e-04
  CSA_P2  : -4.89120e-05 ± 8.66343e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [13]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2445', '1.800', '0.1662', '1.800', '0.0849', '7.000', '0.7079', 1, 1, 1, 1, 1727700061.1750429]
VI_after__Init : ['1.202', '0.2445', '1.800', '0.1663', '1.800', '0.0798', '7.000', '0.7081', 1, 1, 1, 1, 1727700069.3095257]
VI_at__the_End : ['1.201', '0.4794', '1.800', '0.1351', '1.800', '0.1130', '7.000', '0.7088', 1, 1, 1, 1, 1727700139.3154192]