TEST_NAME : Wafer
TEST_DATE : 24_09_30-14_39_23
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-007-014-10 | FUSED_ID : 6359364768409612522
  IC_TEMP :  -56.25 | VDDM : 1130.09 | AUX_INT :   -6.52 | CsaBias :   77.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.55364e-04 / 2
  ADC_P0  : -6.51508e-03 ± 1.97873e-02
  ADC_P1  : 8.41267e-03 ± 4.91902e-04
  ADC_P2  : -5.86402e-06 ± 2.41156e-06
  CSA_Chi2/NDF : 9.47164e-05 / 2
  CSA_P0  : 5.78772e-02 ± 6.49135e-03
  CSA_P1  : 9.53119e-03 ± 4.89076e-04
  CSA_P2  : -4.14995e-05 ± 7.44805e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1401', '1.800', '0.1054', '1.800', '0.0862', '7.000', '0.7079', 1, 1, 1, 1, 1727699963.544336]
VI_after__Init : ['1.202', '0.1401', '1.800', '0.1054', '1.800', '0.0807', '7.000', '0.7079', 1, 1, 1, 1, 1727699971.5647113]
VI_at__the_End : ['1.200', '0.4878', '1.800', '0.1381', '1.800', '0.1117', '7.000', '0.7090', 1, 1, 1, 1, 1727700032.1422653]