TEST_NAME : Wafer
TEST_DATE : 24_09_30-14_32_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-007-018-13 | FUSED_ID : 6359364768409612589
  IC_TEMP :  -58.93 | VDDM : 1121.25 | AUX_INT :   -7.83 | CsaBias :   68.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12917e-03 / 2
  ADC_P0  : -7.83415e-03 ± 2.27348e-02
  ADC_P1  : 8.53537e-03 ± 5.64063e-04
  ADC_P2  : -6.42689e-06 ± 2.76532e-06
  CSA_Chi2/NDF : 1.19333e-04 / 2
  CSA_P0  : 5.95786e-02 ± 7.28621e-03
  CSA_P1  : 9.89881e-03 ± 5.48964e-04
  CSA_P2  : -4.72533e-05 ± 8.36006e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [62]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1642', '1.800', '0.1566', '1.800', '0.0835', '7.000', '0.7086', 1, 1, 1, 1, 1727699571.3407223]
VI_after__Init : ['1.202', '0.1642', '1.800', '0.1566', '1.800', '0.0767', '7.000', '0.7079', 1, 1, 1, 1, 1727699579.5760648]
VI_at__the_End : ['1.202', '0.4917', '1.800', '0.1393', '1.800', '0.1145', '7.000', '0.7088', 1, 1, 1, 1, 1727699646.5258217]