TEST_NAME : Wafer
TEST_DATE : 24_09_30-15_00_38
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-008-003-14 | FUSED_ID : 6359364768409616446
  IC_TEMP :  -63.64 | VDDM : 1129.78 | AUX_INT :   -9.30 | CsaBias :   90.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58023e-03 / 2
  ADC_P0  : -9.29995e-03 ± 2.69380e-02
  ADC_P1  : 8.35011e-03 ± 6.49377e-04
  ADC_P2  : -6.19163e-06 ± 3.10105e-06
  CSA_Chi2/NDF : 1.24090e-04 / 2
  CSA_P0  : 5.73263e-02 ± 7.43004e-03
  CSA_P1  : 9.59870e-03 ± 5.59800e-04
  CSA_P2  : -4.27149e-05 ± 8.52509e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [19, 34, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1962', '1.800', '0.1380', '1.800', '0.0828', '7.000', '0.7080', 1, 1, 1, 1, 1727701237.7957296]
VI_after__Init : ['1.202', '0.1960', '1.800', '0.1378', '1.800', '0.0773', '7.000', '0.7079', 1, 1, 1, 1, 1727701245.9550803]
VI_at__the_End : ['1.202', '0.4879', '1.800', '0.1372', '1.807', '0.1127', '7.000', '0.7086', 1, 1, 1, 1, 1727701305.5806386]