TEST_NAME : Wafer
TEST_DATE : 24_09_30-15_02_15
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-008-004-14 | FUSED_ID : 6359364768409616462
  IC_TEMP :  -59.45 | VDDM : 1113.13 | AUX_INT :   -8.08 | CsaBias :   75.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23217e-03 / 2
  ADC_P0  : -8.07513e-03 ± 2.37052e-02
  ADC_P1  : 8.46846e-03 ± 5.70026e-04
  ADC_P2  : -6.90914e-06 ± 2.71368e-06
  CSA_Chi2/NDF : 1.30524e-04 / 2
  CSA_P0  : 5.79514e-02 ± 7.62022e-03
  CSA_P1  : 9.75192e-03 ± 5.74128e-04
  CSA_P2  : -4.36664e-05 ± 8.74329e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4198', '1.800', '0.1556', '1.800', '0.0946', '7.000', '0.7080', 1, 1, 1, 1, 1727701335.5272915]
VI_after__Init : ['1.202', '0.4203', '1.800', '0.1557', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1727701343.7667322]
VI_at__the_End : ['1.202', '0.4950', '1.800', '0.1398', '1.800', '0.1128', '7.000', '0.7088', 1, 1, 1, 1, 1727701409.3457358]