TEST_NAME : Wafer
TEST_DATE : 24_09_30-15_18_37
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-008-014-14 | FUSED_ID : 6359364768409616622
  IC_TEMP :  -61.32 | VDDM : 1119.95 | AUX_INT : -110.73 | CsaBias :    1.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22019e-03 / 2
  ADC_P0  : -1.10726e-01 ± 2.86831e-02
  ADC_P1  : 1.03046e-02 ± 6.99631e-04
  ADC_P2  : -1.22101e-05 ± 3.35625e-06
  CSA_Chi2/NDF : 1.18879e-04 / 2
  CSA_P0  : 5.94440e-02 ± 7.27234e-03
  CSA_P1  : 1.00989e-02 ± 5.47918e-04
  CSA_P2  : -5.08601e-05 ± 8.34415e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [21]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [64]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2955', '1.800', '0.1655', '1.800', '0.0927', '7.000', '0.7081', 1, 1, 1, 1, 1727702317.543935]
VI_after__Init : ['1.202', '0.2956', '1.800', '0.1655', '1.800', '0.0870', '7.000', '0.7082', 1, 1, 1, 1, 1727702325.5493445]
VI_at__the_End : ['1.202', '0.4900', '1.800', '0.1412', '1.800', '0.1148', '7.000', '0.7086', 1, 1, 1, 1, 1727702395.6830313]