TEST_NAME : Wafer
TEST_DATE : 24_09_30-16_17_29
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-009-005-03 | FUSED_ID : 6359364768409620563
  IC_TEMP :  -60.86 | VDDM : 1119.66 | AUX_INT :  -10.12 | CsaBias :   71.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62208e-03 / 2
  ADC_P0  : -1.01249e-02 ± 2.72712e-02
  ADC_P1  : 8.23772e-03 ± 6.42979e-04
  ADC_P2  : -6.12120e-06 ± 3.01341e-06
  CSA_Chi2/NDF : 1.10824e-04 / 2
  CSA_P0  : 5.88118e-02 ± 7.02165e-03
  CSA_P1  : 9.38011e-03 ± 5.29030e-04
  CSA_P2  : -4.05794e-05 ± 8.05651e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [46]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3347', '1.800', '0.1415', '1.800', '0.0940', '7.000', '0.7078', 1, 1, 1, 1, 1727705849.159769]
VI_after__Init : ['1.202', '0.3348', '1.799', '0.1414', '1.800', '0.0886', '7.000', '0.7079', 1, 1, 1, 1, 1727705857.1892016]
VI_at__the_End : ['1.202', '0.4840', '1.800', '0.1376', '1.800', '0.1123', '7.000', '0.7089', 1, 1, 1, 1, 1727705924.9730194]