TEST_NAME : Wafer
TEST_DATE : 24_09_30-16_15_50
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-009-006-03 | FUSED_ID : 6359364768409620579
  IC_TEMP :  -61.21 | VDDM : 1121.59 | AUX_INT :   -8.77 | CsaBias :   78.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25659e-03 / 2
  ADC_P0  : -8.76765e-03 ± 2.39952e-02
  ADC_P1  : 7.97773e-03 ± 5.55779e-04
  ADC_P2  : -5.46265e-06 ± 2.55527e-06
  CSA_Chi2/NDF : 9.51433e-05 / 2
  CSA_P0  : 5.80871e-02 ± 6.50596e-03
  CSA_P1  : 9.49100e-03 ± 4.90177e-04
  CSA_P2  : -4.18250e-05 ± 7.46482e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2413', '1.800', '0.1457', '1.800', '0.0862', '7.000', '0.7079', 1, 1, 1, 1, 1727705750.5125308]
VI_after__Init : ['1.202', '0.2414', '1.800', '0.1457', '1.800', '0.0806', '7.000', '0.7080', 1, 1, 1, 1, 1727705758.5169108]
VI_at__the_End : ['1.201', '0.4866', '1.800', '0.1342', '1.800', '0.1132', '7.000', '0.7088', 1, 1, 1, 1, 1727705818.7162576]