TEST_NAME : Wafer
TEST_DATE : 24_09_30-16_12_35
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-009-008-03 | FUSED_ID : 6359364768409620611
  IC_TEMP :  -56.94 | VDDM : 1130.06 | AUX_INT :   -8.31 | CsaBias :   81.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42942e-03 / 2
  ADC_P0  : -8.31334e-03 ± 2.56661e-02
  ADC_P1  : 8.24420e-03 ± 6.27273e-04
  ADC_P2  : -5.25372e-06 ± 3.03987e-06
  CSA_Chi2/NDF : 1.55172e-04 / 2
  CSA_P0  : 5.89494e-02 ± 8.30863e-03
  CSA_P1  : 9.89428e-03 ± 6.25995e-04
  CSA_P2  : -4.67678e-05 ± 9.53317e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [39, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2725', '1.800', '0.1620', '1.800', '0.0929', '7.000', '0.7090', 1, 1, 1, 1, 1727705554.8097212]
VI_after__Init : ['1.201', '0.2726', '1.800', '0.1619', '1.800', '0.0859', '7.000', '0.7082', 1, 1, 1, 1, 1727705563.5110574]
VI_at__the_End : ['1.201', '0.4948', '1.800', '0.1414', '1.800', '0.1128', '7.000', '0.7086', 1, 1, 1, 1, 1727705629.6389134]