TEST_NAME : Wafer
TEST_DATE : 24_09_30-16_02_47
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-009-014-03 | FUSED_ID : 6359364768409620707
  IC_TEMP :  -59.47 | VDDM : 1125.46 | AUX_INT :   -8.12 | CsaBias :   66.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09631e-03 / 2
  ADC_P0  : -8.11661e-03 ± 2.24012e-02
  ADC_P1  : 8.37094e-03 ± 5.46174e-04
  ADC_P2  : -6.00807e-06 ± 2.63882e-06
  CSA_Chi2/NDF : 1.29082e-04 / 2
  CSA_P0  : 6.05713e-02 ± 7.57801e-03
  CSA_P1  : 9.97628e-03 ± 5.70949e-04
  CSA_P2  : -4.85483e-05 ± 8.69487e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2547', '1.800', '0.1485', '1.800', '0.0965', '7.000', '0.7086', 1, 1, 1, 1, 1727704967.1764467]
VI_after__Init : ['1.202', '0.2547', '1.800', '0.1486', '1.800', '0.0893', '7.000', '0.7080', 1, 1, 1, 1, 1727704975.8747435]
VI_at__the_End : ['1.202', '0.4929', '1.800', '0.1414', '1.800', '0.1138', '7.000', '0.7088', 1, 1, 1, 1, 1727705043.8374186]