TEST_NAME : Wafer
TEST_DATE : 24_09_30-16_28_56
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-010-005-13 | FUSED_ID : 6359364768409624669
  IC_TEMP :  -55.92 | VDDM : 1124.54 | AUX_INT :   -8.65 | CsaBias :   88.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45150e-03 / 2
  ADC_P0  : -8.65320e-03 ± 2.58275e-02
  ADC_P1  : 8.14426e-03 ± 6.13416e-04
  ADC_P2  : -5.64225e-06 ± 2.88540e-06
  CSA_Chi2/NDF : 8.96752e-05 / 2
  CSA_P0  : 5.90537e-02 ± 6.31624e-03
  CSA_P1  : 9.45855e-03 ± 4.75883e-04
  CSA_P2  : -3.96900e-05 ± 7.24713e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [59]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3075', '1.800', '0.1975', '1.800', '0.0905', '7.000', '0.7079', 1, 1, 1, 1, 1727706535.8516378]
VI_after__Init : ['1.202', '0.3075', '1.800', '0.1978', '1.800', '0.0849', '7.000', '0.7081', 1, 1, 1, 1, 1727706543.9020178]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1391', '1.800', '0.1107', '7.000', '0.7089', 1, 1, 1, 1, 1727706610.3568866]