TEST_NAME : Wafer
TEST_DATE : 24_09_30-16_33_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-010-008-13 | FUSED_ID : 6359364768409624717
  IC_TEMP :  -57.00 | VDDM : 1122.44 | AUX_INT :   -9.00 | CsaBias :   87.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46392e-03 / 2
  ADC_P0  : -9.00079e-03 ± 2.59454e-02
  ADC_P1  : 8.14830e-03 ± 6.18132e-04
  ADC_P2  : -5.47530e-06 ± 2.92339e-06
  CSA_Chi2/NDF : 9.71646e-05 / 2
  CSA_P0  : 5.89289e-02 ± 6.57471e-03
  CSA_P1  : 9.53722e-03 ± 4.95357e-04
  CSA_P2  : -4.23358e-05 ± 7.54370e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [26]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [33]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1854', '1.800', '0.1811', '1.799', '0.0921', '7.000', '0.7078', 1, 1, 1, 1, 1727706830.8818445]
VI_after__Init : ['1.202', '0.1855', '1.800', '0.1811', '1.800', '0.0866', '7.000', '0.7080', 1, 1, 1, 1, 1727706838.9061797]
VI_at__the_End : ['1.202', '0.4882', '1.800', '0.1373', '1.800', '0.1138', '7.000', '0.7086', 1, 1, 1, 1, 1727706894.317887]