TEST_NAME : Wafer
TEST_DATE : 24_09_30-16_51_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-010-019-10 | FUSED_ID : 6359364768409624890
  IC_TEMP :  -61.03 | VDDM : 1118.43 | AUX_INT :   -9.71 | CsaBias :   85.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50794e-03 / 2
  ADC_P0  : -9.71132e-03 ± 2.63123e-02
  ADC_P1  : 8.03755e-03 ± 6.13294e-04
  ADC_P2  : -5.42616e-06 ± 2.84716e-06
  CSA_Chi2/NDF : 1.26586e-04 / 2
  CSA_P0  : 5.84282e-02 ± 7.50437e-03
  CSA_P1  : 9.98496e-03 ± 5.65400e-04
  CSA_P2  : -4.83052e-05 ± 8.61038e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2794', '1.800', '0.1495', '1.799', '0.0892', '7.000', '0.7077', 1, 1, 1, 1, 1727707910.8902693]
VI_after__Init : ['1.201', '0.2793', '1.800', '0.1495', '1.800', '0.0837', '7.000', '0.7081', 1, 1, 1, 1, 1727707918.9706516]
VI_at__the_End : ['1.201', '0.4898', '1.800', '0.1359', '1.799', '0.1138', '7.000', '0.7087', 1, 1, 1, 1, 1727707974.3363814]