TEST_NAME : Wafer
TEST_DATE : 24_09_30-17_45_23
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-011-003-00 | FUSED_ID : 6359364768409628720
  IC_TEMP :  -55.26 | VDDM : 1119.44 | AUX_INT :   -8.18 | CsaBias :   81.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18578e-03 / 2
  ADC_P0  : -8.18148e-03 ± 2.33490e-02
  ADC_P1  : 8.19964e-03 ± 5.67529e-04
  ADC_P2  : -5.13880e-06 ± 2.74034e-06
  CSA_Chi2/NDF : 1.37602e-04 / 2
  CSA_P0  : 6.04053e-02 ± 7.82412e-03
  CSA_P1  : 9.92945e-03 ± 5.89491e-04
  CSA_P2  : -4.50827e-05 ± 8.97725e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [57]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3586', '1.800', '0.1582', '1.800', '0.0879', '7.000', '0.7080', 1, 1, 1, 1, 1727711123.0423055]
VI_after__Init : ['1.202', '0.3589', '1.800', '0.1582', '1.800', '0.0821', '7.000', '0.7079', 1, 1, 1, 1, 1727711131.046742]
VI_at__the_End : ['1.202', '0.5034', '1.800', '0.1410', '1.800', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1727711191.154223]