TEST_NAME : Wafer
TEST_DATE : 24_09_30-17_12_41
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-011-023-07 | FUSED_ID : 6359364768409629047
  IC_TEMP :  -55.93 | VDDM : 1105.77 | AUX_INT :   -8.12 | CsaBias :   83.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09631e-03 / 2
  ADC_P0  : -8.11661e-03 ± 2.24012e-02
  ADC_P1  : 8.37094e-03 ± 5.46174e-04
  ADC_P2  : -6.00807e-06 ± 2.63882e-06
  CSA_Chi2/NDF : 9.91988e-05 / 2
  CSA_P0  : 5.72953e-02 ± 6.64317e-03
  CSA_P1  : 9.49931e-03 ± 5.00515e-04
  CSA_P2  : -4.07344e-05 ± 7.62225e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [30]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1575', '1.800', '0.1392', '1.800', '0.0848', '7.000', '0.7080', 1, 1, 1, 1, 1727709161.1638076]
VI_after__Init : ['1.201', '0.1576', '1.800', '0.1393', '1.799', '0.0793', '7.000', '0.7081', 1, 1, 1, 1, 1727709169.3521938]
VI_at__the_End : ['1.199', '0.4915', '1.800', '0.1378', '1.800', '0.1122', '7.000', '0.7086', 1, 1, 1, 1, 1727709236.993182]