TEST_NAME : Wafer
TEST_DATE : 24_09_30-17_06_24
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-011-027-07 | FUSED_ID : 6359364768409629111
  IC_TEMP :  -54.41 | VDDM : 1123.33 | AUX_INT :   -8.33 | CsaBias :   94.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19471e-03 / 2
  ADC_P0  : -8.32620e-03 ± 2.34137e-02
  ADC_P1  : 7.93958e-03 ± 5.45099e-04
  ADC_P2  : -5.17140e-06 ± 2.51731e-06
  CSA_Chi2/NDF : 8.46791e-05 / 2
  CSA_P0  : 5.65126e-02 ± 6.13777e-03
  CSA_P1  : 9.06142e-03 ± 4.62436e-04
  CSA_P2  : -3.38977e-05 ± 7.04236e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4159', '1.800', '0.1439', '1.800', '0.0955', '7.000', '0.7077', 1, 1, 1, 1, 1727708784.091341]
VI_after__Init : ['1.201', '0.4157', '1.800', '0.1439', '1.800', '0.0900', '7.000', '0.7080', 1, 1, 1, 1, 1727708793.0685403]
VI_at__the_End : ['1.202', '0.4919', '1.800', '0.1357', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1727708849.5793877]