TEST_NAME : Wafer
TEST_DATE : 24_09_30-17_51_47
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-012-004-08 | FUSED_ID : 6359364768409632840
  IC_TEMP :  -57.53 | VDDM : 1114.13 | AUX_INT :   -9.24 | CsaBias :   81.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49164e-03 / 2
  ADC_P0  : -9.23636e-03 ± 2.61798e-02
  ADC_P1  : 8.34311e-03 ± 6.33073e-04
  ADC_P2  : -5.98387e-06 ± 3.03985e-06
  CSA_Chi2/NDF : 1.05105e-04 / 2
  CSA_P0  : 5.81758e-02 ± 6.83807e-03
  CSA_P1  : 9.63901e-03 ± 5.15199e-04
  CSA_P2  : -4.25634e-05 ± 7.84588e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1086', '1.800', '0.1635', '1.800', '0.0859', '7.000', '0.7079', 1, 1, 1, 1, 1727711506.7203958]
VI_after__Init : ['1.202', '0.1086', '1.800', '0.1635', '1.800', '0.0803', '7.000', '0.7080', 1, 1, 1, 1, 1727711515.514615]
VI_at__the_End : ['1.202', '0.4929', '1.800', '0.1363', '1.800', '0.1129', '7.000', '0.7088', 1, 1, 1, 1, 1727711574.7691646]