TEST_NAME : Wafer
TEST_DATE : 24_09_30-18_01_36
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-012-010-08 | FUSED_ID : 6359364768409632936
  IC_TEMP :  -59.34 | VDDM : 1117.78 | AUX_INT :  -10.51 | CsaBias :   73.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.06958e-03 / 2
  ADC_P0  : -1.05067e-02 ± 3.09150e-02
  ADC_P1  : 8.42586e-03 ± 7.59201e-04
  ADC_P2  : -5.72791e-06 ± 3.71724e-06
  CSA_Chi2/NDF : 1.34963e-04 / 2
  CSA_P0  : 5.94163e-02 ± 7.74871e-03
  CSA_P1  : 9.94784e-03 ± 5.83809e-04
  CSA_P2  : -4.85884e-05 ± 8.89073e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [21, 42, 73, 89, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [19]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2391', '1.800', '0.1081', '1.800', '0.0852', '7.000', '0.7081', 1, 1, 1, 1, 1727712095.747575]
VI_after__Init : ['1.202', '0.2391', '1.800', '0.1081', '1.800', '0.0796', '7.000', '0.7083', 1, 1, 1, 1, 1727712103.8819826]
VI_at__the_End : ['1.202', '0.4882', '1.800', '0.1398', '1.800', '0.1129', '7.000', '0.7089', 1, 1, 1, 1, 1727712171.3175972]