TEST_NAME : Wafer
TEST_DATE : 24_09_30-18_17_57
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-012-020-15 | FUSED_ID : 6359364768409633103
  IC_TEMP :  -54.43 | VDDM : 1127.95 | AUX_INT :   -5.72 | CsaBias :   84.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05293e-03 / 2
  ADC_P0  : -5.72123e-03 ± 2.19734e-02
  ADC_P1  : 8.30198e-03 ± 5.38038e-04
  ADC_P2  : -5.83234e-06 ± 2.59461e-06
  CSA_Chi2/NDF : 7.33350e-05 / 2
  CSA_P0  : 5.90876e-02 ± 5.71187e-03
  CSA_P1  : 9.26973e-03 ± 4.30348e-04
  CSA_P2  : -3.62537e-05 ± 6.55369e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [57]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2355', '1.800', '0.1298', '1.799', '0.0853', '7.000', '0.7083', 1, 1, 1, 1, 1727713076.7916844]
VI_after__Init : ['1.202', '0.2355', '1.800', '0.1297', '1.800', '0.0798', '7.000', '0.7079', 1, 1, 1, 1, 1727713084.9930336]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1385', '1.800', '0.1125', '7.000', '0.7089', 1, 1, 1, 1, 1727713141.292712]