TEST_NAME : Wafer
TEST_DATE : 24_09_30-19_06_36
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-013-004-05 | FUSED_ID : 6359364768409636933
  IC_TEMP :  -58.37 | VDDM : 1124.55 | AUX_INT :   -7.80 | CsaBias :   88.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04969e-03 / 2
  ADC_P0  : -7.79942e-03 ± 2.19154e-02
  ADC_P1  : 8.05843e-03 ± 5.14391e-04
  ADC_P2  : -5.64355e-06 ± 2.38748e-06
  CSA_Chi2/NDF : 9.59201e-05 / 2
  CSA_P0  : 5.62021e-02 ± 6.53246e-03
  CSA_P1  : 9.52510e-03 ± 4.92174e-04
  CSA_P2  : -3.99711e-05 ± 7.49523e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [7]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4260', '1.800', '0.1747', '1.799', '0.0992', '7.000', '0.7089', 1, 1, 1, 1, 1727715995.8667002]
VI_after__Init : ['1.202', '0.4263', '1.800', '0.1747', '1.800', '0.0912', '7.000', '0.7078', 1, 1, 1, 1, 1727716003.9689817]
VI_at__the_End : ['1.201', '0.4938', '1.800', '0.1345', '1.800', '0.1098', '7.000', '0.7090', 1, 1, 1, 1, 1727716063.2785444]