TEST_NAME : Wafer
TEST_DATE : 24_09_30-19_04_57
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-013-005-05 | FUSED_ID : 6359364768409636949
  IC_TEMP :  -51.93 | VDDM : 1123.85 | AUX_INT :   -5.67 | CsaBias :   98.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42885e-03 / 2
  ADC_P0  : -5.66660e-03 ± 2.56762e-02
  ADC_P1  : 8.08990e-03 ± 6.29028e-04
  ADC_P2  : -4.90513e-06 ± 3.02442e-06
  CSA_Chi2/NDF : 1.08609e-04 / 2
  CSA_P0  : 5.81879e-02 ± 6.95112e-03
  CSA_P1  : 9.25948e-03 ± 5.23717e-04
  CSA_P2  : -3.65679e-05 ± 7.97559e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4247', '1.800', '0.1464', '1.800', '0.0949', '7.000', '0.7090', 1, 1, 1, 1, 1727715897.589029]
VI_after__Init : ['1.202', '0.4248', '1.800', '0.1465', '1.800', '0.0869', '7.000', '0.7079', 1, 1, 1, 1, 1727715905.7345011]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1360', '1.800', '0.1103', '7.000', '0.7087', 1, 1, 1, 1, 1727715966.0269482]