TEST_NAME : Wafer
TEST_DATE : 24_09_30-18_50_14
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-013-014-05 | FUSED_ID : 6359364768409637093
  IC_TEMP :  -53.25 | VDDM : 1124.39 | AUX_INT :   -8.57 | CsaBias :   86.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38405e-03 / 2
  ADC_P0  : -8.57051e-03 ± 2.52369e-02
  ADC_P1  : 7.96704e-03 ± 5.92499e-04
  ADC_P2  : -5.04052e-06 ± 2.76054e-06
  CSA_Chi2/NDF : 6.35229e-05 / 2
  CSA_P0  : 6.06048e-02 ± 5.31603e-03
  CSA_P1  : 9.16070e-03 ± 4.00525e-04
  CSA_P2  : -3.84054e-05 ± 6.09952e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3295', '1.800', '0.1485', '1.800', '0.1007', '7.000', '0.7079', 1, 1, 1, 1, 1727715013.9739852]
VI_after__Init : ['1.202', '0.3298', '1.800', '0.1485', '1.800', '0.0949', '7.000', '0.7082', 1, 1, 1, 1, 1727715022.0982738]
VI_at__the_End : ['1.202', '0.4840', '1.800', '0.1362', '1.800', '0.1122', '7.000', '0.7090', 1, 1, 1, 1, 1727715089.544252]