TEST_NAME : Wafer
TEST_DATE : 24_09_30-18_48_36
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-013-015-05 | FUSED_ID : 6359364768409637109
  IC_TEMP :  -54.17 | VDDM : 1124.25 | AUX_INT :   -7.48 | CsaBias :   81.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25434e-03 / 2
  ADC_P0  : -7.48325e-03 ± 2.39743e-02
  ADC_P1  : 8.12116e-03 ± 5.64576e-04
  ADC_P2  : -5.81329e-06 ± 2.63202e-06
  CSA_Chi2/NDF : 8.61823e-05 / 2
  CSA_P0  : 6.12123e-02 ± 6.19201e-03
  CSA_P1  : 9.36005e-03 ± 4.66523e-04
  CSA_P2  : -3.89129e-05 ± 7.10459e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0485', '1.800', '0.1574', '1.800', '0.0845', '7.000', '0.7087', 1, 1, 1, 1, 1727714916.055382]
VI_after__Init : ['1.202', '0.0485', '1.800', '0.1573', '1.800', '0.0774', '7.000', '0.7081', 1, 1, 1, 1, 1727714924.337777]
VI_at__the_End : ['1.202', '0.4942', '1.800', '0.1349', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727714993.8395221]