TEST_NAME : Wafer
TEST_DATE : 24_09_30-18_46_58
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-013-016-02 | FUSED_ID : 6359364768409637122
  IC_TEMP :  -57.71 | VDDM : 1122.62 | AUX_INT :   -6.92 | CsaBias :   80.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.90066e-04 / 2
  ADC_P0  : -6.92138e-03 ± 2.12932e-02
  ADC_P1  : 8.03439e-03 ± 5.00823e-04
  ADC_P2  : -5.60377e-06 ± 2.32241e-06
  CSA_Chi2/NDF : 9.98422e-05 / 2
  CSA_P0  : 5.65953e-02 ± 6.66468e-03
  CSA_P1  : 9.43706e-03 ± 5.02136e-04
  CSA_P2  : -4.08008e-05 ± 7.64693e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [50]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1008', '1.800', '0.1669', '1.800', '0.0807', '7.000', '0.7080', 1, 1, 1, 1, 1727714817.6578188]
VI_after__Init : ['1.202', '0.1008', '1.800', '0.1669', '1.800', '0.0750', '7.000', '0.7082', 1, 1, 1, 1, 1727714826.5551136]
VI_at__the_End : ['1.202', '0.4868', '1.800', '0.1352', '1.800', '0.1123', '7.000', '0.7085', 1, 1, 1, 1, 1727714892.3171465]