TEST_NAME : Wafer
TEST_DATE : 24_09_30-18_40_26
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-013-020-02 | FUSED_ID : 6359364768409637186
  IC_TEMP :  -57.98 | VDDM : 1126.90 | AUX_INT :   -6.40 | CsaBias :   75.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05851e-03 / 2
  ADC_P0  : -6.39778e-03 ± 2.20077e-02
  ADC_P1  : 8.20062e-03 ± 5.25302e-04
  ADC_P2  : -5.99908e-06 ± 2.47251e-06
  CSA_Chi2/NDF : 8.57723e-05 / 2
  CSA_P0  : 5.97016e-02 ± 6.17726e-03
  CSA_P1  : 9.14064e-03 ± 4.65412e-04
  CSA_P2  : -3.70938e-05 ± 7.08767e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [16, 106, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2280', '1.800', '0.1575', '1.800', '0.0885', '7.000', '0.7079', 1, 1, 1, 1, 1727714425.6403427]
VI_after__Init : ['1.202', '0.2281', '1.800', '0.1575', '1.801', '0.0845', '7.000', '0.7081', 1, 1, 1, 1, 1727714433.8096013]
VI_at__the_End : ['1.202', '0.4879', '1.800', '0.1370', '1.801', '0.1126', '7.000', '0.7089', 1, 1, 1, 1, 1727714501.5595589]