TEST_NAME : Wafer
TEST_DATE : 24_09_30-19_45_49
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-014-025-12 | FUSED_ID : 6359364768409641372
  IC_TEMP :  -51.68 | VDDM : 1136.78 | AUX_INT : -100.60 | CsaBias :   28.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07491e-03 / 2
  ADC_P0  : -1.00603e-01 ± 2.64997e-02
  ADC_P1  : 9.39776e-03 ± 6.00299e-04
  ADC_P2  : -1.01603e-05 ± 2.66356e-06
  CSA_Chi2/NDF : 5.95389e-05 / 2
  CSA_P0  : 5.68883e-02 ± 5.14663e-03
  CSA_P1  : 8.97943e-03 ± 3.87761e-04
  CSA_P2  : -3.12817e-05 ± 5.90514e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [7]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [37]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2598', '1.800', '0.1429', '1.800', '0.0926', '7.000', '0.7092', 1, 1, 1, 1, 1727718349.1461194]
VI_after__Init : ['1.202', '0.2600', '1.800', '0.1429', '1.800', '0.0855', '7.000', '0.7081', 1, 1, 1, 1, 1727718357.2665052]
VI_at__the_End : ['1.202', '0.4957', '1.800', '0.1342', '1.800', '0.1088', '7.000', '0.7088', 1, 1, 1, 1, 1727718418.7753959]