TEST_NAME : Wafer
TEST_DATE : 24_09_30-20_23_19
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-015-004-06 | FUSED_ID : 6359364768409645126
  IC_TEMP :  -58.95 | VDDM : 1116.21 | AUX_INT :  -48.75 | CsaBias :   36.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78833e-03 / 2
  ADC_P0  : -4.87473e-02 ± 3.09002e-02
  ADC_P1  : 9.60613e-03 ± 7.86291e-04
  ADC_P2  : -9.53223e-06 ± 3.94811e-06
  CSA_Chi2/NDF : 1.68191e-04 / 2
  CSA_P0  : 5.87056e-02 ± 8.65015e-03
  CSA_P1  : 1.00801e-02 ± 6.51727e-04
  CSA_P2  : -4.97360e-05 ± 9.92503e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [79, 111, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [43, 68, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2027', '1.800', '0.1676', '1.800', '0.0903', '7.000', '0.7091', 1, 1, 1, 1, 1727720598.579978]
VI_after__Init : ['1.202', '0.2027', '1.800', '0.1675', '1.800', '0.0828', '7.000', '0.7078', 1, 1, 1, 1, 1727720607.4952888]
VI_at__the_End : ['1.202', '0.4900', '1.800', '0.1394', '1.800', '0.1118', '7.000', '0.7089', 1, 1, 1, 1, 1727720666.8036778]