TEST_NAME : Wafer
TEST_DATE : 24_09_30-20_06_58
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-015-014-06 | FUSED_ID : 6359364768409645286
  IC_TEMP :  -54.26 | VDDM : 1129.07 | AUX_INT :   -9.16 | CsaBias :   88.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35741e-03 / 2
  ADC_P0  : -9.15949e-03 ± 2.49216e-02
  ADC_P1  : 8.17429e-03 ± 5.83863e-04
  ADC_P2  : -6.14121e-06 ± 2.70976e-06
  CSA_Chi2/NDF : 5.66233e-05 / 2
  CSA_P0  : 5.60015e-02 ± 5.01903e-03
  CSA_P1  : 8.99671e-03 ± 3.78148e-04
  CSA_P2  : -3.58115e-05 ± 5.75875e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [82, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [6]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3129', '1.800', '0.1232', '1.799', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1727719618.0536842]
VI_after__Init : ['1.201', '0.3131', '1.800', '0.1232', '1.801', '0.0832', '7.000', '0.7080', 1, 1, 1, 1, 1727719626.8030553]
VI_at__the_End : ['1.201', '0.4780', '1.800', '0.1317', '1.800', '0.1111', '7.000', '0.7090', 1, 1, 1, 1, 1727719693.5920284]