TEST_NAME : Wafer
TEST_DATE : 24_09_30-20_28_13
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-016-008-14 | FUSED_ID : 6359364768409649294
  IC_TEMP :  -58.05 | VDDM : 1117.55 | AUX_INT :  -17.92 | CsaBias :   81.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53383e-03 / 2
  ADC_P0  : -1.79191e-02 ± 2.70317e-02
  ADC_P1  : 8.33547e-03 ± 6.50185e-04
  ADC_P2  : -5.69245e-06 ± 3.11040e-06
  CSA_Chi2/NDF : 1.49927e-04 / 2
  CSA_P0  : 5.97355e-02 ± 8.16699e-03
  CSA_P1  : 9.56540e-03 ± 6.15323e-04
  CSA_P2  : -4.21654e-05 ± 9.37065e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [16]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3134', '1.800', '0.1601', '1.800', '0.0835', '7.000', '0.7082', 1, 1, 1, 1, 1727720893.5532455]
VI_after__Init : ['1.202', '0.3136', '1.800', '0.1599', '1.800', '0.0777', '7.000', '0.7080', 1, 1, 1, 1, 1727720901.8396373]
VI_at__the_End : ['1.202', '0.4915', '1.800', '0.1406', '1.799', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1727720968.3225408]