TEST_NAME : Wafer
TEST_DATE : 24_09_30-20_36_24
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-016-013-14 | FUSED_ID : 6359364768409649374
  IC_TEMP :  -58.25 | VDDM : 1126.44 | AUX_INT :   -7.47 | CsaBias :   84.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30239e-03 / 2
  ADC_P0  : -7.46909e-03 ± 2.44531e-02
  ADC_P1  : 8.38591e-03 ± 6.01481e-04
  ADC_P2  : -5.80516e-06 ± 2.93312e-06
  CSA_Chi2/NDF : 1.57666e-04 / 2
  CSA_P0  : 6.04455e-02 ± 8.37514e-03
  CSA_P1  : 1.01319e-02 ± 6.31006e-04
  CSA_P2  : -4.80334e-05 ± 9.60948e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [55, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [15]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3043', '1.800', '0.1610', '1.800', '0.0914', '7.000', '0.7087', 1, 1, 1, 1, 1727721383.743723]
VI_after__Init : ['1.202', '0.3044', '1.800', '0.1610', '1.800', '0.0842', '7.000', '0.7083', 1, 1, 1, 1, 1727721391.8420048]
VI_at__the_End : ['1.202', '0.5046', '1.800', '0.1417', '1.799', '0.1113', '7.000', '0.7087', 1, 1, 1, 1, 1727721460.084836]