TEST_NAME : Wafer
TEST_DATE : 24_09_30-21_08_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-017-013-03 | FUSED_ID : 6359364768409653459
  IC_TEMP :  -64.30 | VDDM : 1117.61 | AUX_INT :   -7.52 | CsaBias :   82.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02776e-03 / 2
  ADC_P0  : -7.52213e-03 ± 2.16342e-02
  ADC_P1  : 8.23435e-03 ± 5.09757e-04
  ADC_P2  : -6.29322e-06 ± 2.38190e-06
  CSA_Chi2/NDF : 1.31107e-04 / 2
  CSA_P0  : 5.99160e-02 ± 7.63723e-03
  CSA_P1  : 9.60921e-03 ± 5.75410e-04
  CSA_P2  : -4.47431e-05 ± 8.76282e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [17]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2631', '1.800', '0.1592', '1.800', '0.0929', '7.000', '0.7091', 1, 1, 1, 1, 1727723330.8423686]
VI_after__Init : ['1.202', '0.2633', '1.800', '0.1592', '1.801', '0.0857', '7.000', '0.7079', 1, 1, 1, 1, 1727723339.0237103]
VI_at__the_End : ['1.202', '0.4838', '1.800', '0.1384', '1.799', '0.1177', '7.000', '0.7087', 1, 1, 1, 1, 1727723398.5291336]