TEST_NAME : Wafer
TEST_DATE : 24_09_30-21_20_18
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-018-009-13 | FUSED_ID : 6359364768409657501
  IC_TEMP :  -58.92 | VDDM : 1135.99 | AUX_INT : -158.96 | CsaBias :  -26.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15331e-03 / 2
  ADC_P0  : -1.58956e-01 ± 3.05581e-02
  ADC_P1  : 1.03680e-02 ± 6.93379e-04
  ADC_P2  : -1.29907e-05 ± 3.08505e-06
  CSA_Chi2/NDF : 1.11569e-04 / 2
  CSA_P0  : 5.77821e-02 ± 7.04522e-03
  CSA_P1  : 9.24234e-03 ± 5.30806e-04
  CSA_P2  : -3.77788e-05 ± 8.08355e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [62, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3012', '1.800', '0.1187', '1.800', '0.0873', '7.000', '0.7081', 1, 1, 1, 1, 1727724017.6007764]
VI_after__Init : ['1.202', '0.3016', '1.800', '0.1187', '1.800', '0.0817', '7.000', '0.7083', 1, 1, 1, 1, 1727724026.4600594]
VI_at__the_End : ['1.202', '0.4866', '1.800', '0.1345', '1.800', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1727724086.84842]