TEST_NAME : Wafer
TEST_DATE : 24_09_30-21_23_35
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-018-011-13 | FUSED_ID : 6359364768409657533
  IC_TEMP :  -53.33 | VDDM : 1124.91 | AUX_INT :   -7.57 | CsaBias :   85.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33170e-03 / 2
  ADC_P0  : -7.56680e-03 ± 2.47465e-02
  ADC_P1  : 7.82557e-03 ± 5.69760e-04
  ADC_P2  : -4.91667e-06 ± 2.60433e-06
  CSA_Chi2/NDF : 7.27306e-05 / 2
  CSA_P0  : 5.73125e-02 ± 5.68828e-03
  CSA_P1  : 9.17588e-03 ± 4.28571e-04
  CSA_P2  : -3.50494e-05 ± 6.52663e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [37]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [55]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2259', '1.800', '0.1394', '1.799', '0.0926', '7.000', '0.7091', 1, 1, 1, 1, 1727724215.0266716]
VI_after__Init : ['1.202', '0.2259', '1.800', '0.1394', '1.801', '0.0851', '7.000', '0.7080', 1, 1, 1, 1, 1727724223.3159707]
VI_at__the_End : ['1.202', '0.4905', '1.800', '0.1360', '1.801', '0.1116', '7.000', '0.7090', 1, 1, 1, 1, 1727724283.0134778]