TEST_NAME : Wafer
TEST_DATE : 24_09_30-21_25_13
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-018-012-13 | FUSED_ID : 6359364768409657549
  IC_TEMP :  -52.91 | VDDM : 1132.95 | AUX_INT :  -88.19 | CsaBias :   18.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41195e-03 / 2
  ADC_P0  : -8.81932e-02 ± 2.99007e-02
  ADC_P1  : 9.00517e-03 ± 6.78066e-04
  ADC_P2  : -8.58135e-06 ± 3.01552e-06
  CSA_Chi2/NDF : 7.42250e-05 / 2
  CSA_P0  : 5.86510e-02 ± 5.74642e-03
  CSA_P1  : 9.09780e-03 ± 4.32951e-04
  CSA_P2  : -3.35635e-05 ± 6.59334e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [1]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [97, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1479', '1.800', '0.1554', '1.800', '0.0869', '7.000', '0.7081', 1, 1, 1, 1, 1727724313.0481026]
VI_after__Init : ['1.202', '0.1480', '1.800', '0.1549', '1.799', '0.0811', '7.000', '0.7083', 1, 1, 1, 1, 1727724321.1325457]
VI_at__the_End : ['1.202', '0.4949', '1.800', '0.1352', '1.801', '0.1125', '7.000', '0.7088', 1, 1, 1, 1, 1727724380.8000104]