TEST_NAME : Wafer
TEST_DATE : 24_09_30-21_38_17
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-018-020-10 | FUSED_ID : 6359364768409657674
  IC_TEMP :  -72.14 | VDDM : 1105.42 | AUX_INT :   -9.69 | CsaBias :   58.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58480e-03 / 2
  ADC_P0  : -9.69496e-03 ± 2.69742e-02
  ADC_P1  : 8.54038e-03 ± 6.62218e-04
  ADC_P2  : -6.49369e-06 ± 3.22915e-06
  CSA_Chi2/NDF : 2.06829e-04 / 2
  CSA_P0  : 5.76663e-02 ± 9.59242e-03
  CSA_P1  : 1.02050e-02 ± 7.22720e-04
  CSA_P2  : -5.41931e-05 ± 1.10062e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [63]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [15, 52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1852', '1.800', '0.1393', '1.799', '0.0876', '7.000', '0.7090', 1, 1, 1, 1, 1727725097.0261075]
VI_after__Init : ['1.202', '0.1854', '1.800', '0.1394', '1.800', '0.0794', '7.000', '0.7078', 1, 1, 1, 1, 1727725106.0084772]
VI_at__the_End : ['1.202', '0.4826', '1.800', '0.1384', '1.799', '0.1179', '7.000', '0.7087', 1, 1, 1, 1, 1727725161.9800363]