TEST_NAME : Wafer
TEST_DATE : 24_10_01-15_12_04
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-002-012-11 | FUSED_ID : 6359364768410640587
  IC_TEMP :  -60.85 | VDDM : 1123.23 | AUX_INT :  -10.29 | CsaBias :   66.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85526e-03 / 2
  ADC_P0  : -1.02926e-02 ± 2.92384e-02
  ADC_P1  : 8.55270e-03 ± 7.26564e-04
  ADC_P2  : -6.03906e-06 ± 3.59669e-06
  CSA_Chi2/NDF : 2.51540e-04 / 2
  CSA_P0  : 5.63170e-02 ± 1.05785e-02
  CSA_P1  : 1.02331e-02 ± 7.97017e-04
  CSA_P2  : -5.33227e-05 ± 1.21376e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2787', '1.800', '0.1140', '1.799', '0.0865', '7.000', '0.7079', 1, 1, 1, 1, 1727788323.5036275]
VI_after__Init : ['1.201', '0.2788', '1.800', '0.1140', '1.801', '0.0813', '7.000', '0.7081', 1, 1, 1, 1, 1727788331.8818073]
VI_at__the_End : ['1.202', '0.4889', '1.800', '0.1359', '1.800', '0.1140', '7.000', '0.7086', 1, 1, 1, 1, 1727788394.8926482]